a theoretical study on van der pauw measurement values of inhomogeneous compound semiconductor thin filmsvan der波夫测量值的理论研究非齐次化合物半导体薄膜.pdfVIP

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a theoretical study on van der pauw measurement values of inhomogeneous compound semiconductor thin filmsvan der波夫测量值的理论研究非齐次化合物半导体薄膜.pdf

a theoretical study on van der pauw measurement values of inhomogeneous compound semiconductor thin filmsvan der波夫测量值的理论研究非齐次化合物半导体薄膜

J. Mod. Phys., 2010, 1, 340-347 doi:10.4236/jmp.2010.15048 Published Online November 2010 (http://www.SciRP.org/journal/jmp) A Theoretical Study on Van Der Pauw Measurement Values of Inhomogeneous Compound Semiconductor Thin Films Toru Matsumura, Yuichi Sato Graduate School of Engineering and Resource Science, Akita University, Tegata-gakuen, Akita, Japan E-mail : yusato@ipc.akita-u.ac.jp

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a theoretical study on van der pauw measurement values of inhomogeneous compound semiconductor thin filmsvan der波夫测量值的理论研究非齐次化合物半导体薄膜.pdfVIP