原创力文档structural and electrical characterization of bi2vo5.5 bi4ti3o12 bilayer thin films deposited by pulsed laser ablation technique结构和电子特性bi2vo5.5 bi4ti3o12双层薄膜沉积的脉冲激光烧蚀技术.pdfVIP
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structural and electrical characterization of bi2vo5.5 bi4ti3o12 bilayer thin films deposited by pulsed laser ablation technique结构和电子特性bi2vo5.5 bi4ti3o12双层薄膜沉积的脉冲激光烧蚀技术
Vol.2, No.10, 1073-1078 (2010) Natural Science
/10.4236/ns.2010.210133
Structural and electrical characterization of Bi VO /
2 5.5
Bi Ti O bilayer thin films deposited by pulsed laser
4 3 12
ablation technique
Neelam Kumari, Saluru Baba Krupanidhi, Kalidhindi Balakrishna Raj
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