Texas Instruments DLP174; NIRscan Nano （德州仪器DLP174;）.pdf

Application Report DLPA062– January 2016 Texas Instruments DLP® NIRscan ™ Nano Evaluation Module (EVM) Optical Design Considerations GavinPerrella ABSTRACT TI DLP® technology offers unique benefits and functionality to spectrometer design. For a comparison of DLP spectroscopy to existing technologies see Texas Instruments DLP Technology for Spectroscopy (DLPA048). The optical design of a DLP spectrometer involves interactions between many interdependent parameters. Modification of individual components often requires the simultaneous alteration of numerous other elements in order to maintain desired performance levels. This application report identifies the key optical parameters, and discusses their interdependent impact on system size and performance. The design choices for the DLP NIRscan™ Nano EVM are explained, and from these, generally applicable design guidelines are derived. Contents 1 System Layout 2 2 Illumination Module 3 3 Fiber Coupled Illumination 4 4 DMD F-Number 4 5 DMD Illumination Angle 4 6 Slit Parameters 5 7 Spectral Resolution 5 8 Diffraction Grating 6 9 Condenser and Detector 6 10 Optical Lens Elements 6