非接触ic卡芯片的低成本测试（Low cost testing contactless IC card chip）.docVIP

非接触ic卡芯片的低成本测试（Low cost testing contactless IC card chip） Collected by oneself Mistakes are unavoidable For reference only In case of error Please correct me! Thanks Low cost test of contactless IC card chip Edwan test (Suzhou Co., Ltd.) Shanghai branch Liu Yang Abstract: with the continuous maturity of RFID technology and specifications Second generation ID card in China began the use of contactless IC card chip based on RFID Technology Testing issues for design verification and mass production This paper introduces a solution of low cost test for contactless IC card chip Compared with the co