x射线衍射仪的原理及其在高分子科学中的应用张吉东.pptVIP

Reflectivity Interference The mutual influence, under certain conditions, of two streams of light, or series of pulsations of sound, or, generally, two waves or vibrations of any kind, producing certain characteristic phenomena, as colored fringes, dark bands, or darkness, in the case of light, silence or increased intensity in sounds; Interference → thickness θm2 = m2 ?2 / 4d2 + θc2 d = ? / 2 (θm+1 - θm ) Kiessig oscillation X射线衍射表征高分子材料 EVA * Our system d = 8.8 / Δ2θ (nm) d = ? / 2 (θm+1 - θm ) Reflectivity X射线衍射表征高分子材料 Simulation Fitting Software Leptos Simplex Simulated Annealing Leve