前沿文献阅读Recent Advancement of Nondestructive Inspection Technology.docx

Recent Advancement of Nondestructive Inspection TechnologyAbstract—In this paper, the nondestructive testing (NDT) of present interest for research and industrial applications is described. Besides ac and pulsed eddy-current testing, magnetic flux leakage testing, passive magnetic flux leakage for characterization of material degradation, and various inversion techniques are presented. Both simulation and experimental results are used to demonstrate validity of the electromagnetic NDT methods. Electromagnetic nondestructive tests are important and widely used withinthe field of nondestructive evaluation (NDE). The recent advances in sensing technology,hardware and software development dedicated to imaging and image processing, andmaterial sciences have greatly expanded the application fields, sophisticated the systemsdesign and made the potential of electromagnetic NDE imaging seemingly unlimited. This review provides a comprehensive summary of research works on electromagneticimaging methods for NDE applications, followed by the summary and discussions on futuredirections.Index Terms—Eddy-current testing, inverse problem, magneticmaterials, neural networks, optimization, electromagneticImaging, noninvasive imaging, nondestructive evaluation, Direct Current Voltage Gradient.INTRODUCTIONSteel wire ropes are widely applied in many fields, suchas transaction, architecture, et al, and its safety operation ispaid more attention to[1]. Visual inspection and routinereplacement are used to avoid the accident, but visualinspection can only detect surface flaws, routine replacementcan make large economic waste. So, the development of thestable steel wire rope inspector is very necessary. In 1906, thefirst inspector was invented by C. McCann and R. Colson[2],until now, the studied inspector methods contains acousticemission, electromagnetic method, X-ray and others. Amongthem, the electromagnetic method is practical.The wire rope flaw has two categories, localized flaw(LF) and