159液晶技术概论.pptVIP

TFT-LCD截切面圗 LCD Process and AOI LCD檢測設備與分類 薄膜電晶體面板缺陷示意 薄膜電晶體製程之缺陷 C/F的瑕疵分類 Color Filter之缺陷 MURA 的產生原因 Color Filter內層版檢查機架構圖 IC封裝瑕疵種類與特徵參數 OLED OLED to LCD OLED製程與檢測 A Novel AOI System for OLED Panel Inspection Der-Baau Perng, Yen-Chung Chen, and Meng-Kun Lee, Dept. Industrial Engineering Management National Chiao-Tung University Hsin-Chu, TAIWAN Introduction(1/4) Organic light emitting diode (OLED) Emit red, green, blue or white light. Without any other source of luminance. OLED present bright, clear video and images. Easy to see at almost any angle. Introduction(2/4) OLED low yield rate problem Result from the defects in the manufacturing process. Introduction(3/4) Commonly observed OLED defects. Introduction(4/4) Defect size? 0.01 mm2 ? too small for human to inspect To develop an AOI system (Moving mechanism + lighting devices + inspection algorithms) ? to inspect the defects of OLED robustly and quickly. ? to assure the quality of OLED panel. System structure(2/2) CCD res. : 1600*1200 Pixel size : 25μm FOV : 40mm*30mm Covered size : 1/3 OLED panel Three captured images cover entire OLED panel with overlapping. Inspection method – defects classification Important quality indicators of OLED panel: ? Luminance, outward appearance and color. Three classes of defects are classified. Class I defect inspection Related with OLED luminance Dark point Non-uniform luminance Conducting fixture: design to conduct and light up the OLED panel. Dark Point Inspection (DPI) OLED panel was stacked up with several thin layers of materials, including PF layer, metal layer and circuit layer. DPI – based on conducting fixture Advanced DPI Two different lighting methods: UV light ? stimulate the PF layer Back light ? illuminate the metal layer Advanced DPI - based on UV light Advanced DPI - based on back light Non-uniform luminance inspection - based on conducting fixture Class II defect inspection C