CPK Training 资料.ppt

管制圖與常態分配 Cpk Vs Defective Yield 制程能力與規格之關系 中心偏离時dppm的計算 off-center(σ) 面積 z 常態曲線下之面積 e=2.718... 0 Z=(x- μ)/σ 投影片 16 1.對設計單位提供基本資料; 2.分派工作到機器上; 3.用來驗收全新或翻新調整過的設備; 4.選用合格的作業員; 5.設定生產線的機器; 6.根據規格公差設定設備的管制界限; 7.當制程能力超越公差時,決定最經濟的作業水準; 8.找出最好的作業方法. Version:1.1 A. Trial Run Data Collection Sample Size 1~10 11~20 21~30 31~40 41~50 51~60 61~70 71~80 42.787 42.824 42.772 42.706 42.832 42.874 42.806 42.702 42.775 42.717 42.836 42.845 42.825 42.833 42.805 42.708 42.792 42.780 42.823 42.774 42.836 42.898 42.807 42.695 42.778 42.803 42.801 42.692 42.807 42.785 42.807 42.728 42.791 42.758 42.836 42.863 42.829 42.842 42.840 42.840 42.810 42.825 42.836 42.861 42.832 42.845 42.836 42.863 42.729 42.759 42.817 42.836 42.824 42.823 42.796 42.670 42.850 42.696 42.830 42.865 42.830 42.842 42.822 42.803 42.791 42.779 42.827 42.780 42.833 42.891 42.805 42.695 42.850 42.696 42.830 42.865 42.830 42.842 42.822 42.803 Calculation μ=42.804 Sigma= 0.051 Max= 42.898 Min= 42.670 (at Design Phase) How to Define Specification Verify the Process Capability Input Area for Data Item No. Quality Level Specification Format LSL USL DRL (Dppm) DRR (Dppm) DR (Dppm) 1 1 Sigma μ±1 Sigma 42.804 42.753 42.855 158655.26 158655.26 317310.52 2 1.5 Sigma μ±1.5 Sigma 42.804 42.727 42.880 66807.23 66807.23 133614.46 3 2 Sigma μ±2 Sigma 42.804 42.702 42.906 22750.06 22750.06 45500.12 4 2.5 Sigma μ±2.5 Sigma 42.804 42.676 42.931 6209.68 6209.68 12419.36 5 3 Sigma μ±3 Sigma 42.804 42.650 42.957 1349.97 1349.97 2699.93 6 3.5 Sigma μ±3.5 Sigma 42.804 42.625 42.982 232.67 232.67 465.35 7 4 Sigma μ±4 Sigma 42.804 42.599 43.008 31.69 31.69 63.37 8 4.5 Sigma μ±4.5Sigma 42.804 42.574 43.033 3.40 3.40 6.80 9 5 Sigma μ±5 Sigma 42.804 42.548 43.059 0.287105 0.287105 0.57 10 5.5 Sigma μ±5.5 Sigma 42.804 42.523 43.084 0.019036 0.019036 0.04 11 6 Sigma μ±6 Sigma 42.804 42.497 43.110 0.00099 0.00099 0.00 Prepared by :VQM /Xu Gang Approved by: Howard Lin B.Quality Level (For your reference and choosing) μ *Silitek Electronics (GZ