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Solid-State Electronics 52 (2008) 1127–1139
Contents lists available at ScienceDirect
Solid-State Electronics
journal homepage: www.el /locate/sse
Review
ESD protection design for I/O libraries in advanced CMOS technologies
Oleg Semenov *, Sergei Somov
Freescale Semiconductor LLC, Research Laboratory, Savelkinsky Proezd 4, Floor 11, Zelenograd, Moscow 124489, Russia
a r t i c l e i n f o a b s t r a c t
Article history: There are several approaches for ESD protection of integrated circuits. This paper provides practical
Received 17 November 2007 guidelines to I/O library designers to choose the right methodology for ESD protection of I/O libraries
Received in revised form 8 May 2008 in advanced CMOS technologies. Guidelines are provided predominantly for low-voltage I/O libraries that
Accepted 12 May 2008
are commonly used for general purpose interfaces and industrial low-voltage interfaces such as DDR,
Available online 27 June 2008
MLB, USB, etc. Additionally, some general background issues of ESD protection methodologies used in
The review of this paper was arranged by the industry are considered. This paper is focused on HBM and MM ESD protection solutions. Special
Prof. S. Cristoloveanu CDM ESD protection sol
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