改善铝箔蚀孔密度与均匀性之电源波形设计.PDFVIP

NSC93 2 NSC93-2216-R-002-020 recorded, in which the breakdown potential was measured. A scanning electron microscope was employed for characterizing the surface morphology and cross section of the foil, (GVP) including the average depth and linear density of the pits. Cross-sectional transmission (SEM) electron microscope specimens were prepared from the as-etched foil to reveal the detailed pit (TEM) morphology and etch film structure. Finally, X-ray photoelectron spectra of the surface film (XPS) on the as-etched foil were measured using