电子系统故障诊断及测试性课程设计.docVIP

电子系统故障诊断与测试性课程设计 1. 模拟/混合+电路)*（诊断+测试性/可测性）；文献来源： IEEE期刊论文或国外专利。每人选一篇，不要重复。 A Design-For-Test Structure for Optimising Analogue and Mixed Signal IC Test Abstract—A new Design-for-Test (DfT) structure based on a configurable operational amplifier, referred to as a “swap amp” is presented that allows access to embedded analogue blocks. The structure has minimal impact on circuit performance and has been evaluated on a custom designed Phase Locked Loop (PLL) structure. A test chip containing faulty and fault free versions of this PLL structure, with and without DfT modifications, has been fabricated and an evaluation of this DfT scheme based on the swap-amp structure carried out. It is shown that for embedded analogue blocks, the DfT strategy can not only improve and simplify analogue mixed signal IC test, but can also be used for diagnostics. 摘要-基于可配置的运算放大器，被称为“交换放大器”的新的可测性设计结构（DFT）允许访问嵌入式模拟块。该结构对电路性能的影响很小，并已在定制设计的锁相环（PLL）结构上进行评估。生产的测试芯片基于交换放大器结构进行了DFT评估，它包含有无故障的PLL结构，有无DFT的修改。结果表明：对于嵌入式模拟块，DFT的策略，不仅可以改善和简化模拟与混合信号IC测试，但也可以用于诊断。 2. 实现多信号模型实时诊断算法，C语言或Matlab皆可以，并以下面某系统依赖矩阵进行测试验证。 附一：实时诊断被测电路 图2-1分压电路 表2-1优化后的故障源-测试依赖矩阵 报警情况：虚拟测试中t13和t32发生报警，其他的几个虚拟测试不发生报警。 其次，对报警点分析，虚拟测试中发生报警的测试点对应测试单元不正常，即可检查出R3为故障点。可得源程序： #includestdio.h void main(void) { int i,j,a=3,b=7; //a,b:报警 int A[7]={0,0,0,0,0,0,0}, B[7]={0,0,0,0,0,0,0}, int ARRAY[7][9] = {{0,0,0,0,1,0,0,0,1}, {0,1,0,0,0,0,0,1,0}, {0,0,0,1,0,0,0,1,0}, {0,0,0,1,0,0,1,0,0}, {1,0,0,0,0,1,0,0,0}, {0,0,1,0,0,1,0,0,0}, {0,0,0,1,0,1,0,0,0}}; //判断矩阵 /*输出正常点*/ for(j=0;j3;j++) { for(i=0;i7;i++) { if(ARRAY [i][j]==1) { A[i]=1; } } } for(j=4;j7;j++) { for(i=0;i7;i++) { if(ARRAY [i][j]==1) { A[i]=1; } } } for(i=0;i7;i++) { if(ARRAY [i][8]==1) { A[i]=1; } } /*输出可能出问题点*/ for(i=0;i7;i++) { if(A[i]==1) NULL; else if(ARRAY [i][a]==1) { B[i]=1; } } for(i=0;i7;i++) { if(A[i]==1) NULL; else if(ARRAY [i][b]==1) {