A STATE OF THE ART ON ADC MODELINGADC的建模研究现状.pdf

A STATE OF THE ART ON ADC MODELING P. Arpaia, P. Daponte, S. Rapuano Dipartimento di Ingegneria, Facoltà di Ingegneria, Università del Sannio, Palazzo Dell’Aquila Bosco Lucarelli, Piazza Roma, 82100, Benevento, Italy. Ph. ++39 0824 305817, Fax ++39 0824 305840, E-mail {arpaia, daponte, rapuano}@unisannio.it. Abstract - The state of the art of the research on 2. QUANTIZATION MODELS modelling of analog-to-digital converter-based measuring devices is surveyed. Main topics of In last ten years, research on ADC modelling modelling are reviewed according to the fields of related to the quantization can be classified on the basis prevailing scientific interest in metrological research of the effects of quantization models on (i) the ADC such as quantization models, error models, and errors, (ii) the dithering, and (iii) the testing strategy. correction-aimed models. In these fields, recent In the last decade, the effects of quantization models developments are analysed with the aim of focusing on ADC errors have been investigated with the main both the contemporary situation and the imminent aim of assessing the conditions for the model validity trends. [1]-[3]. Conversely, the current research trend is aimed at overcoming the limitations due to the assumption of uniform distribution of the