Testing n the Fourth Dimension在第四密度的测试.pptVIP

ATS00 Testing in the Fourth Dimension Vishwani D. Agrawal Bell Labs, Murray Hill, NJ 07974 USA va@ /cm/cs/who/va The 9th Asian Test Symposium Taipei, December 4, 2000 Present and Future* Cost of Testing in 2000AD 0.5-1.0GHz, analog instruments,1,024 digital pins: ATE purchase price = $1.2M + 1,024 x $3,000 = $4.272M Running cost (five-year linear depreciation) = Depreciation + Maintenance + Operation = $0.854M + $0.085M + $0.5M = $1.439M/yr Test cost (24 hour ATE operation) = $1.439M/(365 x 24 x 3,600) = 4.5 cents/second Challenges of Testing High-speed tests for transition faults or critica