卡座连接器测试知识Testknwegefthecnnectrcnnectr.doc

卡座连接器测试知识Testknwegefthecnnectrcnnectr.doc

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卡座连接器测试知识Testknwegefthecnnectrcnnectr

卡座连接器测试知识(Test knowledge of the connector connector) 1 / f, Knowledge introduction = = SD card seat MINI SD card seat, CF card seat SIM card seat Knowledge introduction = = SD card seat MINI SD card seat, CF card seat SIM card seat One, the connector of the card is used commonly used material Name material Base LCP/nylon high temperature, low warping, good resistance Contact phosphor bronze conductivity is good, elastic large, the Contact area is gilded, the welding area is plated tin Switch (Switch) phosphorus bronze Shell (Cover) phosphorus bronze/stainless steel Spring steel wire The stainless steel surface is smooth and abrasive The heart type groove (Guide) nylon is high temperature resistance, good wear resistance and good resistance The anti-flying terminal (Lock) stainless steel 2. Minimum PIN number of commonly used card holders Name PIN number switch number remark MS series 10 0 MS Micro Card 11 0 SD series 9 4 MMC 7 0 can share SD track and PIN RS MMC 13 0 Micro SD/t-flash 10, 2 19 0 xD Card SM Card 22 April CF Card 50 The second floor SIM Card 6 0 Express Card 26 0 PCMCIA Card 68 0 Three, the test of the card connector ? Connectors commonly used test specifications ? MIL - std-1344a (U.S. military code) ? EIA - 364C (American institute of electronic technology) ? IEC - 512 (international electronic commission) ? 4. Main test items of connector ? Electrical characteristic test ? Mechanical characteristic test ? Environmental test 1. Insulation Resistance test (Insulation Resistance) ? Measurement purpose: to evaluate the insulation level of the insulation material of the connector after passing the dc voltage. ? Measurement basis: IEC 512-2-3 A ? Measurement method: ? The test position is nearest to the adjacent two terminals or terminals and the iron case, if the coaxial connector is the internal and external terminals. ? Test time: 2 minutes. ? Test voltage: 500V DC or special. ? Test results: ? MS/SD/MMC Card: testing before the 1000 m or more Ω; After

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