材料表征教学资料 spm资料教程.ppt

* Non-Contact Mode A new era in imaging was opened when microscopists introduced a system for implementing the non-contact mode which is used in situations where tip contact might alter the sample in subtle ways. In this mode the tip hovers 50 - 150 Angstrom above the sample surface. Attractive Van der Waals forces acting between the tip and the sample are detected, and topographic images are constructed by scanning the tip above the surface. * Non-Contact Mode Unfortunately the attractive forces from the sample are substantially weaker than the repulsive forces used by contact mode. Theref