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* AFM Application Example I Three and two dimensional image of a DVD stamper surface. The scan range is 10 X 10 microns and the maximum Z range is 192 nanometers. Section profile can be obtained easily. * AFM Application Example II AFM is ideal for quantitatively measuring the nanometer scale surface roughness and for visualizing the surface nano-texture on many types of material surfaces. Advantages of the AFM for such applications are derived from the fact that the AFM is nondestructive and it has a very high three dimensional spatial resolution. nano-surface texture/roughness * AFM Application Example II Measuring the surface texture of samples with horizontal length scale of less than 10 microns and a vertical length scale of 100 nanometers is critical for many areas of science and technology. For example, surface texture can alter the optical properties of materials, control adhesive properties of polymers, effect the yield of processed silicon wafers, and control the density of stored magnetic materials. * AFM Application Example II Often it is difficult to fully characterize surface texture without direct visualization of a surface. AFMs are well suited for visualization of surface texture, especially when the surface feature sizes are far below one micron. Illustrated below is the surface texture of a piece of commercially available recording tape. 10 μm X 10 μm AFM image of commercially available magnetic tape showing the surface texture. The maximum Z scale on this image is 48.5 nanometers. Such images facilitate a visual inspection of surface roughness and texture. * AFM Application Example II After acquiring an AFM image it is possible to measure the 1-D surface roughness on a line in the horizontal or vertical direction in the image. After identifying the line for the measurement, a computer calculates all of the relevant parameters. line surface roughness of a polymer film * AFM Application Example II Optimal characterization of surface texture