SEMEDX和FTIR在手机电触点失效分析方面的应用-失效分析与预防.PDFVIP

2010 5 M ay, 2010 5 2 Vol. 5, No. 2 SEM /EDX FTIR 1, 2 1 2 , , 琲 ( 1.摩托罗拉材料失效分析实验室, 天津 300457; 2. 天津大学材料学院, 天津 300072) [ ] SEM /EDX F IR , , EDX , SEM /EDX F IR, , [] SEM /EDX; F IR; ; ; [] N929. 53; M 501. 3 [] A doi: 10. 3969/.j issn. 2010. 02. 013 [] 2010) Application of SEM /EDX and FTIR to FailureAnalysis ofElectricalContacts ofMobile Phones 1, 2 1 2 LIU Ping , L IU Jianyong , YAO Bei ( 1. M FA L, M otorola (China) E lectronics L td., T ianj in 300457, China; 2. College of M aterial Science Engineering, Tianj in Universit , T ianj in 300072, China) Abstract: Som e typ ical cases on electrical contact failure analysis by SEM /EDX and F IR were summ arized. It is found that the m ain failure cause of the electrical contacts is the rise of electric resistance caused by surface contam ination and oxidation. Gen erally, the contam inants have comp lex appearance and composition. Using SEM /EDX and F IR, m ost of the contam inants intro duced in the course of production and service can be identified, such as scraps, m anmade contam inants, dusts, and viscose contam inants. eywords: SEM /EDX; F IR; electrical contact; contam inant; failure analysis , , 0 , , [ 34] , , , , ,