约瑟夫森结参数对Shapiro台阶的影响研究-电子学报.PDFVIP

5 Vol . 37 No . 5 2009 5 ACTA ELECTRON CA S N CA May 2009 Shapiro 刘飞连, 周铁戈, 王定城, 李 娜, 赵新杰, 方 兰, 阎少林 ( , 300071) : PSpice , C , ( I R ) Shapiro . R c n n , R n . R n , I c - , , . THz . : ; Shapiro ; ; THz : TN12 : A : ( 2009) Influence of Josephson Junction Parameters on Shapiro Steps L U Feilian, ZHOU T iege, WANG Dingcheng, L Na, ZHAO Xinjie, FANG Lan, YAN Shaolin ( Dep artment of Electronics , N ankai Universi ty , Tianj in 300071, Chi na ) Abstract: The simulating model of Josephson junctions in PSpice is constructed and used in the investigation of Shapiro steps. n the condition of little capacitance, we have researched the influence of resistively and capacitively shunted Josephson junc tion s parameters, including critical current and normal resistance, on Shapiro steps. We found that it can impro ve the steps by both to reduce the normal resistance under a larger rfcurrent circumstance and to increase the normal resistance in the condition of a smaller rfcurrent . We also found that the larger the j unction critical current, the higher the Shapiro steps, when the junction resis tance keeps constant . The results are of important referential value for the voltage standard and THz signal detection by Jo sephson junctions. Key words: jo sephson junction; shapiro step; voltage standard; THz signal detection