一种用于嵌入式内存测试的高效诊断算法-应用科学学报.PDFVIP

　23 　2 Vol.23, No.2　 　2005 3 JOURNAL OF APPLIED SCIENCES Mar.2005 　 　　:0255-8297 (2005)02-0178-05 任爱玲, 　凌　明, 　吴光林, 　李　锐 ( , 210096 ) 　:MARCH-TB+, , 2k×1 ., , . :;; :TN407　　　:A An Efficient Diagnosis Algorithm for the Test of Embedded SRAM REN A -l ng, 　LING M ng, 　WU Guang-l n, 　LI Ru (National ASI C Sy stem Engineering Research Center, Southeast University , Nanj ing 210096, China) Abstract:Th s paper puts forward an self-d agnos s b t-or ented algor thm (MARCH-TB+), accord ng to the test ng algor thms,we u se a shared bu lt-n-self-test structure (parallel structure)to test and d agnose embedded SRAM (2k×1).The exper mental results show that the proposed test ng algor thm has h gh fault coverage, strong d agnost c ab l ty and requ res less test ng t me. Key words:d agnos s algor thm;bu lt-n-self-test;embedded RAM [4] [5,6] 　　(SOC), , RSMarch [7] , , ;MARCH-TB 60%, , , , . , MARCH-TB , MARCH-TB +, , , MARCH-TB , SAF . TF 4 , [1] , . . , . 1 　MARCH-TB [2] [2] MARCH C- ,MATS ++ , [3] [7] MARCH-CW , , 1.1　 . , , RSMarch .AF :2003-11-11;　:2004-02-20 :(60 1760 18) :(1978-), , , , E-ma l:a l ng2008@eyou.con 　2 : 179 (address decoder fault )、(read wr te log c ,“ ”,“