TI-电容隔离技术详解.pptVIP

Above diagram shows TDDB (Time Dependent Dielectric Breakdown) test results, drawn on a semi-logarithmic scale, time to fail in years over stress-voltage in RMS-volts. A number of devices from different production lots is stressed continuously with voltages exceeding the rated voltage by far. For each test-voltage, the time to fail for the first part failing is noted. The pink dots show ADIs test results taken at 800Vrms through 1200Vrms the non-linear extrapolation results into the 50years lifetime-prediction at 565V peak or ~400Vrms. The green dots show TI’s ISO721 test-points, for quick res