GB/T 2423.27-2005电工电子产品环境试验　第2部分：试验方法　试验Z/AMD：低温/低气压/湿热连续综合试验.pdf

ICS 19.040 K 04 绷黔 中 华 人 民 共 和 国 国 家 标 准 GB/T2423.27-2005八EC60068-2-39:1976 代替GB/T 2423.27- 1981 电工电子产品环境试验 第2部分:试验方法 试验Z/AMD 低温/低气压/湿热连续综合试验 Environmentaltestingforelectricandelectronicproducts- Part2:Testsmethods-TestZ/AMD:Combinedsequentialcold, lowairpressureanddampheattest (IEC60068-2-39:1976,Basicenvironmentaltestingprocedures- Part2:Tests-TestZ/AMD:Combinedsequentialcold， lowairpressureanddampheattest,IDT) 2005-08-26发布 2006-04-01实施 中华人民共和国国家质量监督检验检疫总局 中 国 国家 标 准 化 管 理 委 员会 发 布 GB/T 2423.27-2005/IEC60068-2-39:1976 目 次 前 言 目 的 试验的一般说明，。。。。····，··，·························································，·，·。。，····，，，············……1 试验设备的说明 ···，·，。。。。。·。。·，，·，，，，，，················································、·。········，，，·········……1 试验程序 ··························，··，·······，··············································‘，。·。···，，，，··… … 1 预处理 ·······，，，····I 初始检测 ···············，·，，甲，，，··················，··，，···，一 1 条件试验 ··········································，·。··，，····，，，································。···············…… 2 恢复 ···························，，·······················，···，·······························。 ········。·。。·····，，，，二2 最后检测 ·····································。·······，，，，·，，·················································。，·。·，2 相关规范应作出的信息··························，·····，····，·，，，·····，·，············，·····················…·…2 GB/T2423.27-2006八EC60068-2-39:1976 前 言 本部分是GB/T2423《电工电子产品环境试验