x-射线光电子能谱.pptVIP

Nanoscopic Characterization Methods: X-ray Photoelectron Spectroscopy XPS: System Characteristics Introduction Background Theory Instrumentation System Performance Sensitivity Resolution Limitations Current Applications Future Improvements XPS: Introduction Characterization of surface composition/ molecular functionality X-radiation of surfaces ejects photoelectrons Electrons analyzed by detector, energy determined Orbitals possess characteristic eV assignments; correlated to determine elemental composition ? ? ? XPS: Theory Based on Einstein’s Relationship: E = photon energy, h = Plancks constant ( 6.62 x 10-34 J s ), c =speed of light, and v = frequency (Hz) of the radiation. XPS: Theory Initial Conditions A + hv =A+ + e- Conservation of Energy E(A) + hv = E(A+ ) + E(e-) Rearrange Eq., obtain KE KE = hv - E(A+ ) + E(A) Final Equation KE = hv – BE, *Where BE= energy difference between ionized and ground state KE = hv – BE-Φ, when work function included XPS: Theory Other Conditions to Consider: Doublet States Secondary Reactions Doublet States ? (1s)2 (2s)2 (2p)6 (3s)2 (3p)6 (3d)10 .... Instrumental Components X-Ray Source: Twin Anode Mg/Al Source Monochromatic Source Analyzer: Concentric Hemispherical Analyzer (CHA) Detector: Channeltron Electron Multiplier Vacuum System Instrumental Components X-Ray Source: Twin Anode Mg/Al Source Uses electric filament to produce electrons Accelerate towards anode and generate x-rays Switch between anodes to choose photon energy Simple, inexpensive High flux of x-ray photons Poor resolution Monochromatic Source Uses diffraction through quartz crystal to select x-ray photons of certain wavelengths Improves resolution Instrumental Components Analyzer: Concentric Hemispherical Analyzer (CHA): 2 concentric hemispheres of different radii Voltage bias applied – vary to scan energy spectrum Filter electrons by selecting electrons of certain kinetic energy Instrumental Components Detector: Channeltron electron