用于线宽测量的双探针原子力显微镜系统分析.pdfVIP

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用于线宽测量的双探针原子力显微镜系统分析.pdf

ABSTRACT Withthe in ofthesemiconductorrecent critical development industry years,the dimensionsof ckcuRsaretowardbelowthe22nm nodes.The integrated technology sizeofthedevicebecomes makescriticaldimensionbecomean smaller,which factortoaffecttheelectrical ofthedevice.Howtomeasureand important properties contro

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