FocalTech电容式触控技术-资料(1).pptVIP

抗老化 老化后的Raw data 功耗 手机操作时整机功耗 触摸屏系统不能影响电池的续航能力 工作时≤10mA是可以接受的数值 ESD TP系统的ESD主要与TP结构，手机结构等等有关 IC的ESD主要是运输，装配过程的需求 HBM 2000V，MM 200V是基本要求 封装 针对手机结构空间有限，封装越小越好 FocalTech提供的方案最小封装为QFN40 5mm×5mm封装和BGA59 5mm×5mm封装 接口 触摸屏控制IC与系统的接口 主流为I2C FocalTech方案能提供I2C，SPI，USB接口 Key touch controller players vs Focaltech 内容纲要 FocalTech电容式触控IC原理介绍 电容式触控IC的性能指标 电容式触摸屏的测试方法及效果 电容式触摸屏的发展趋势 Report rate Report rate (or update rate), T (ms) T Accuracy Jitter test Accuracy test: repeatedly tapping Jitter test: stationary touching Accuracy test Linearity test Speed=20mm/s Linearity test Sensitivity test EMI test (Example) No radiation 900MHz EMS test (Example) TX RX TX RX Small capacitance TX RX Model of Floating issue No touch Touch + System grounding Touch + System floating Floating issue caused lower sensitivity! Brass with a small capacitance For instance, 1pF TP Testing method for Floating issue Waveform of adapter Testing method for power Power noise @Frequency(KHz) 3.5 5 10 50 100 150 200 250 300 350 400 450 500 VPP 40(±20) NG NG NG NG NG NG NG NG NG NG NG NG NG 35(±17.5) NG NG NG NG NG NG NG NG NG NG NG NG NG 30(±15) NG NG NG NG NG NG NG NG NG NG NG NG NG 25(±12.5) NG NG NG NG NG NG NG NG NG NG NG NG NG 20(±10) OK OK OK NG NG NG NG NG NG NG NG NG NG 15(±7.5) OK OK OK OK NG NG NG NG NG NG NG NG NG 10(±5) OK OK OK OK OK OK OK OK OK OK OK OK OK 5(±2.5) OK OK OK OK OK OK OK OK OK OK OK OK OK Power noise test results AC adapter caused power noise Qualification items Windows Phone 7 recommended Test items 内容纲要 FocalTech电容式触控IC原理介绍 电容式触控IC的性能指标 电容式触摸屏的测试方法及效果 电容式触摸屏的发展趋势 电容式触控发展基本趋势 标准化 轻薄化 Glass和film共存 On-cell和In-cell 逐点触摸反馈技术开始出现 标准化 技术逐渐成熟稳定 抗干扰技术增强，RF、电源、水和环境变化不再成为问题 性能特征标准化，包括线性度，准确度和悬空等 结构趋于稳定——逐渐稳定到主流的结构 Glass以SITO为主 Film以DITO为主 性能两级分化 普通产品以互电容为主 极低端产品以自电容为主 轻薄化 轻薄化是设计需求 ITO on cover lens切合这样的需求 钢化玻璃的切割技术将获得突破 单片玻璃完成原来两片玻璃功能 On-cell亦切合这样的需求 Glass和film共存 Glass与Film各具优缺点 Glass将发展向ITO on cover lens Film将发展向单片DITO Film，能有效降低成本，并更加轻薄 On-cell和In-cell On-cell逐渐进入量产 与ITO on cover lens相比，并不具备成本