材料测试分析7.pdfVIP

X射线光电子能谱分析 X-ray Photoelectron Spectroscopy 表面分析技术(Surface Analysis)是对材料外层(the Outer-Most Layers of Materials (100nm))的研究的 技术 Electrons are extracted only from a narrow solid X-ray Beam angle. X-ray penetration depth ~1mm. Electrons can be 10 nm excited in this entire volume.