in situ transmission electron microscopy characterization and manipulation of two-dimensional layered materials beyond graphene.[2017][small][10.10英文精品课件.pdf

Nanodevices In Situ Transmission Electron Microscopy Characterization and Manipulation of Two-Dimensional Layered Materials beyond Graphene Chen Luo, Chaolun Wang, Xing Wu,* Jian Zhang, and Junhao Chu From the Contents 1. Introduction 2 Two-dimensional (2D) ultra-thin materials beyond graphene 2. Ex Situ TEM Characterization of 2D with rich physical properties and unique layered structures are Layered Materials 4 promising for applications in electronics, chemistry, energy, and bioscience, etc. The interaction mechanisms among the 3. In Situ TEM Manipulation of 2D structures, chemical compositions and physical properties of Layered Materials 7 2D layered materials are critical for fundamental nanosciences and the practical fabrication of next-generation nanodevices. 4. Summary and Outlook 13 Transmission electron microscopy (TEM), with its high spatial resolution and versatile external fields, is undoubtedly a powerful tool for the static characterization and dynamic manipulation of nanomaterials and nanodevices at the atomic scale. The rapid development of thin-film and precision microelectromechanical systems (MEMS) techniques allows 2D layered materials and nanodevices to be probed and engineered inside TEM under external stimuli such as thermal, electrical, mechanical, liq