Presentation 22 - 当前可告性建模解决方案的现状 (1).pdfVIP

Status of Current Reliability Modeling Solutions MA Long Keysight Technologies long_ma@ Status of Current Agenda Reliability Modeling Solutions Page 2 – Motivation – Aging Effects and the Characterization – Reliability Simulation and Models – Summary Design and Modeling Challenges – Decreasing Vdd leads to diminishing headroom. – ICs operating near or above extreme conditions – Foundries provide different tools/ models, or no models at all – Models are proprietary, unknown equations and limited capability of implementing user-defined equations – Eager to have the model • Support all important aging effects • Be compatible with existing SPICE simulators Status of Current Reliability Modeling Solutions Page 3 Increasing Importance – The devices continue scaling down to meet the strong demands to the performance and functions on electric devices. – There are accompanying increases in both electric field strength and current density, which in turn act to reduce device lifetimes. – New processes, materials and structures are introduced for new generation devices, and this brings new challenges for the reliability. Status of Current Relia