发光二极管可靠性和寿命评价试验方法-图文(精).pdfVIP

第29卷第4期 应用光学 V01.29No.4 2008年7月 Journal of Applied 0ptics JuI.2008 文章编号:1002—2082(200804一0533一04 大功率发光二极管可靠性和寿命评价试验方法 贺卫利,郭伟 ,高 伟,史 辰,陈 曦,吴 娟,陈建新 (北京工业大学电控学院光 电子技术实验室,北京100022 摘 要:介绍了发光二极管(LED的发展简史。提出可能影响LED可靠性的几种因素,主要 有 封装中的散热问题和LED本身材料缺陷。对于LED可靠性,主要方法是通过测试其寿 命来分析其 可靠性,一般采取加速实验的方法来测试推导LED寿命。介绍了根据加速应力(主要 分为单一加 速应力和复合加速应力2种评价LED寿命的测试方法。在不同加速试验应力条件下 测试了大功 率LED可靠性,并建立了LED寿命的几种数学模型。最后根据具体实例,通过选择加 速应力和试 验方法,给出具体推导LED寿命的数学公式。 关键 :发光二极管;寿命评价试验方法;加速应力;数学模型 中图分类号:TN384文献标志码:A Test method of life—time and reliability eValuation for high—power LED HE Wei—li, GUO Wei—ling,GA0 (0ptoelectronic Technology Lab, Wei,SHI Chen,CHEN Xi, Beijing University of Technology, WU Juan,CHEN Jian—xin Beijing 100022,China Abstract:The development history of the light—emitting diode(LEDis introduced. SeVeral factors influencing LED reliability are put forward,among which the material defectiVeness of LED and the heat dissipation during packaging are the main factors.The reliability eValuation of LED is analyzed by testing the LED lifetime,which is usually derived from the accelerated test. The testing methods to evaluate LED lifetime according to the accelerated stress(single and composite accelerated stressesare listed and introduced. The reliability of high—power LEDs was tested and several mathematical models of the LED lifetime were derived under different accelerated stresses. The mathematical formula for deriving the LED lifetime is given based on some examples. Key words:light—emitting diode (LED; testing method of lifetime eValuation;accelerated stress;mathematical model 引言 自1968年利用氮掺杂工艺使GaAsP红色发光 二极管(LED的发光效率达到1lm/w以来,LED 的研究得到迅速发展。1985年,采用液相外延法, 使得AlGaAs LED的发光强度首次突破1cd…。20世纪90年代初对于InGaAlP四元系材料的研究, 不仅大大提高了LED的效率,还将高亮度LED的 光谱从红光扩展到黄光和黄绿光[2。]。20世纪90年 代中期,Nakamura等人[5也采用MOCVD方法成 功制备出高亮度InGaN/AlGaN双异质结蓝光 LED和InGaN量子阱结构紫外LED。GaN基蓝光 LED的出现及其效率的迅速提高,使LED得以形 收稿日期:2007-