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- 约7.91千字
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- 2021-10-19 发布于广东
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纳米逻辑芯片制造流程;Logic Circuit: 能够 展现 精确的模拟特性,;VDD;基本电路结构:MOS器件结构;18LG adopt 27 Photo mask , if include ESD layer
AA/Poly/CT/ M1~M5/ V1~V5 use DUV scanner (13 layer)
“ DARC” Cap on Critical layer and Top M6
Poly M1~M5 adopt OPC (optical proximity correction)
for line-end shorting island missing
Composite Spacer (ONO)
PSM method apply on CT layer
Cobalt salicide process
Low K IMD layer (FSG);Outline;WAFER START RS CHECK
P type 8 ~ 12 ohm-cm, non-EPI wafer
Start OX 100A dry
1. PR isolation 2. Prevent the laser mark Si recast
3. Surface cleanness 4. Backside oxidati
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