基于缺陷工程的超灵敏SERS检测.pdfVIP

www.advmat.de N Ultrasensitive SERS Detection by Defect Engineering on O I T Single Cu O Superstructure Particle A 2 C I N Jie Lin, Yang Shang, Xiaoxia Li, Jian Yu, Xiaotian Wang, and Lin Guo* U M M O Surface-enhanced Raman spectroscopy (SERS) was discov- of matter-light interaction by multiple light scattering in C ered in 1970s by Fleischmann et al.[1] and Vanduyne and co- microarray. Bontempi et al. reported that the LOD of Si workers.[2] As a powerful analysis technique, SERS has been nanowire arrays SERS substrate for methylene blue molecules widely employed in the fields of chemistry, nanomaterials, and could reach to 10−7 m by morphology-induced light trapping in particular life sciences for food security, chemical catalysis, effect.[15] Although semiconductor SERS has been successfully biochemistry, trace chemicals, etc.[3] Due to the existence of improved, the highest sensitivity in these strategies could only electromagnetic mechanism, noble metals are usually used as reach to 10−7 m, far away from the limit of detection by noble effective SERS substrates in which a huge electromagnetic field metal substrate. is produced and the Raman signal of the target molecule is Zhao and co-workers[16] reported a metal-comparable EF greatly magnified.[4] However, the high cost, poor uniformity of (3.4 × 105) and lower LOD (10−7 m for Rhodamine 6G (R6G) spectrum,