近代分析实验原理：第九课-扫描探针显微镜.pptVIP

Intermittent 间歇的 * The dynamic mode uses stiff cantilevers while static mode uses soft cantilevers. In the non-contact mode (Figure 5.10a), all forces between tip and sample are attractive, and the short-range force between the outermost atoms of tip and sample atoms makes a significant contribution to imaging. In the contact mode (Figure 5.10b), a repulsive force occurs between tip apex atoms and the surface atoms, even though the total force is still attractive. The difference between the static and dynamic modes can be illustrated using a graph of force versus distance between the tip and a sample. In Figures 5.10c and 5.10d, solid lines represent the total force and the dashed lines represent the short-range force. The dynamic mode uses stiff cantilevers while static mode uses soft cantilevers. Figure 5.10c illustrates a case of dynamic mode. The closest distance between the tip and the sample is marked as z, where the situation is comparable to that illustrated in Figure 5.10a. The arrow marked A indicates the typical amplitude of tip oscillation. The closest distance is the turning point of force curve in order to prevent the tip from being trapped at the sample surface. Figure 5.10d illustrates a case of contact mode. The contact position (z) is on the repulsive side of the short-range force curve. The arrow pointed to the left on Figure 5.10d represents the phenomenon of tip jump-to-contact with the sample caused by cantilever elastic bending when the tip is brought near to the surface. The arrow pointed to the right represents the phenomenon of tip jump-off-contact caused by elastic recovery of the cantilever when the tip is retracted from the surface. The phenomena of jump-to and jump-off are characteristics of cantilever behavior in the contact mode. The ‘jump positions’ on the force curve depend on the spring constant of the cantilever (k). * The resolution of the contact mode depends on a contact area at the tip apex. The contact diameter (a) can be est