内容讲稿测试课1.pptxVIP

Extra TopicRedundancy Removal Using ATPG;Irredundant Hardware and Test Patterns;Redundant Hardware and Simplification;Redundant Fault q sa1;Multiple Fault Masking;Multiple Fault Masking;Intentional Redundant Implicantion;Lecture 4Major Combinational Automatic Test-Pattern Generation Algorithms;D Notation;5 Valued D Algebra;（1）D-Cube;D Intersection (∩) Operations;（2）Primitive D-Cubes of a Fault (PDF);Bridging Fault Circuit;Bridging Fault D-Cubes of Failure;（3）Singular Cover (SC);Example;（4）Propagation D-Cube (PDC);（5）Test Cube (TC);D-frontier;D-Drive;Implication;Forward Implication;Backward Implication;Backtrack;Implication Stack after Backtrack;Objectives and Backtracing of ATPG Algorithm;Implication Procedure;Circuit and Truth Table;Singular Cover D-Cubes;Steps for Fault d sa0;D-ALG Example #2;D-ALG Example #2 (Cont.);Flowchart of D-ALG;D-Algorithm – Top Level;D-Algorithm – D-drive;D-Algorithm -- Consistency;Backtrack;Example 7.3 – Fault s sa1;Example 7.3 – Step 2 s sa1;Example 7.3 – Step 2 s sa1;Example 7.3 – Step 3 s sa1;Example 7.3 – Fault u sa1;Example 7.3 – Step 2 u sa1;Example 7.3 – Step 2 u sa1;Inconsistent;Example 7.3 – Backtrack;Example 7.3 – Step 3 u sa1;Example 7.3 – Step 4 u sa1;Example 7.3 – Step 4 u sa1;Summary of D-ALG;Heuristic Search vs Exhaustive Search