X射线光电子能谱(XPS).pptVIP

X-ray Photoelectron Spectrometer Analysis of Materials for Solar Energy Collection by XPS Depth Profiling- The amorphous-SiC/SnO2 Interface The profile indicates a reduction of the SnO2 occurred at the interface during deposition. Such a reduction would effect the collector’s efficiency. Photo-voltaic Collector Conductive Oxide- SnO2 p-type a-SiC a-Si Solar Energy SnO2 Sn Depth 500 496 492 488 484 480 Binding Energy, eV Data courtesy A. Nurrudin and J. Abelson, University of Illinois Small area analysis and imaging Small area analysis and imaging Small area analysis and imaging 谢谢观看/欢迎下载