AEC - Q100-006 - Rev-D - -电热诱导的寄生门漏电测试Electro-Thermally Induced Parasitic Gate Leakage Test.pdf

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AEC - Q100-006 - Rev-D - -电热诱导的寄生门漏电测试Electro-Thermally Induced Parasitic Gate Leakage Test.pdf

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AEC - Q100-006 - REV-D July 18, 2003 Automotive Electronics Council Component Technical Committee ATTACHMENT 6 AEC - Q100-006 REV-D ELECTRO-THERMALLY INDUCED PARASITIC GATE LEAKAGE TEST (GL) AEC - Q100-006 - REV-D July 18, 2003 Automotive Electronics Council Component Technical Committee Acknowledgment Any document involving a complex technology brings together experience and skills from many sources. The Automotive Electronics Counsel would especially like to recognize the following significant contributors to the development of this document: Mark A. Kelly Delphi Delco Electronics Systems AEC - Q100-006 - REV-D July 18, 2003 Automotive Electronics Council Component Technical Committee Change Notification The following summary details the changes incorporated into AEC-Q100-006 Rev-D: Sections 3.5, 3.5.1, and 3.5.2: Deleted section title 3.5, Detailed Procedure. Changed section 3.5.1 to section 3.5 and section 3.5.2 to section 3.6. AEC - Q100-006 - REV-D July 18, 2003 Automotive Electronics Council Component Technical Committee METHOD - 006