AEC - Q002 Rev - B1 Guidelines for Statistical Yield Analysis(统计良率分析指南.pdf

AEC - Q002 Rev B January 12, 2012 Automotive Electronics Council Component Technical Committee GUIDELINES FOR STATISTICAL YIELD ANALYSIS AEC - Q002 Rev B January 12, 2012 Automotive Electronics Council Component Technical Committee Acknowledgment Any document involving a complex technology brings together experience and skills from many sources. The Automotive Electronics Council would especially like to recognize the following significant contributors to the development and release of this document: Statistical Yield Analysis Sub-Committee Members: Tim Haifley Altera Liam Ryan Analog Devices Xin Miao Zhao Cirrus Logic Roger Tyldesley Cypress Semiconductor Steve Barlow Delphi Corporation John Monteiro Delphi Corporation Paul Grosch Freescale Nick Lycoudes Freescale Laurie McTurk Freescale James Stanley Freescale Ahmad Abde-Yazdani Infineon Horst Lewitschnig Infineon Gary Fisher Johnson Controls Tom Lawler Lattice Semiconductor Harmeet Sobti Maxim Stefan Eichenberger NXP Zhongning Liang NXP Tony Walsh Renesas Electronics Francis Classe Spansion Bassel Atallah ST