AEC - Q001 Rev - D Guidelines for Part Average Testing零件平均测试指南.pdf

AEC - Q001 Rev-D December 9, 2011 Automotive Electronics Council Component Technical Committee GUIDELINES FOR PART AVERAGE TESTING AEC - Q001 Rev-D December 9, 2011 Automotive Electronics Council Component Technical Committee Acknowledgment Any document involving a complex technology brings together experience and skills from many sources. The Automotive Electronics Counsel would especially like to recognize the following significant contributors to the development and release of this document: Process Average Testing Sub-Committee Members: Tim Haifley Altera Frank McNally Analog Devices Rod Boutwell Cirrus Logic Xin Miao Zhao Cirrus Logic John Monteiro Delphi Corporation Paul Grosch Freescale Nick Lycoudes Freescale Laurie McTurk Freescale James Stanley Freescale Ahmad Abde-Yazdani Infineon Horst Lewitschnig Infineon Banjie Bautista ISSI Gary Fisher Johnson Controls Robert Alvarado Lattice Semiconductor Mike Buzinski Microchip Stefan Eichenberger NXP Annette Nettles Renesas Electronics Nga Nguyen Texas Instruments Shwetha Shekar Texas Instruments Cinti Chen Xilinx Andrew Flynn Xilinx Kathy Seebe