Agilent Routine Analysis of Organic Samples by ICP-MS - The New Benchmark [Technical Feature] 说明书用户手.pdf

Routine Analysis of Organic Samples by ICP-MS - The New Benchmark The analysis of organic samples is challenging for ICP- MS. The physical properties of heavy organics matrices cause a high plasma and interface loading, which can lead to incomplete sample dissociation, while the high carbon content gives rise to new interferences - notably C (on Mg) and ArC (on Ca). The Agilent 7500 Series has been developed to handle even heavy organics routinely: sample introduction and plasma system design and the ShieldTorch interface enable virtually any organic matrix to be measured at ultratrace levels (including Mg and Cr). Key features of the 7500 Series include: •Standard Peltier cooled spray chamber for reduced solvent vapour loading •High ion transmission to allow the use of low sample Figure 1 – Calibration of Mg in IPA uptake rates (50-400 ul/min), which dramatically absence of peaks in the blank and the good fit of reduces plasma loading elemental templates confirm that both types of •High energy, solid state 27.12MHz plasma for interference have been effectively removed. optimum energy transfer and complete sample matrix dissociation. •ShieldTorch cool plasma for complete removal of C-based interferences Semiconductor Organics Agilents ShieldTorch interface enables operation under high power cool plasma conditions (typically 900W), to completely remove C-based interferences while still retaining enough power to dissociate the sample matrix. Figure 1 shows a standard addition calibration of Mg in IPA - with excellent sensitivity and linearity at the 5ppt level. Mg was measured at 6ppq in the IPA, demonstrating the complete removal of C at mass 24. Ag