增材制造相关标准汇总.docxVIP

ASTM-52900 - Standard Terminology for Additive Manufacturing – General Principles – Terminology ASTM-52915 - Standard Specification for Additive Manufacturing File Format (AMF) Version 1.2 ASTM-52921 - Standard Terminology for Additive Manufacturing-Coordinate Systems and Test Methodologies ASTM-E1392 - Standard Practice for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces (Withdrawn 2003) ASTM-E2544 - Standard Terminology for Three-Dimensional (3D) Imaging Systems ASTM-E2641 - Standard Practice for Best Practices for Safe Application of 3D Imaging Technology ASTM-E2807 - Standard Specification for 3D Imaging Data Exchange, Version 1.0 ASTM-E2919 - Standard Test Method for Evaluating the Performance of Systems that Measure Static, Six Degrees of Freedom (6DOF), Pose ASTM-E2938 - Standard Test Method for Evaluating the Relative-Range Measurement Performance of 3D Imaging Systems in the Medium Range ASTM-E3064 - Standard Test Method for Evaluating the Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose ASTM-E3124 - Standard Test Method for Measuring System Latency Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose ASTM-E3125 - Standard Test Method for Evaluating the Point-to-Point Distance Measurement Performance of Spherical Coordinate 3D Imaging Systems in the Medium Range ASTM-F1 - Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes (Withdrawn 2009) ASTM-F1032 - Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994) ASTM-F1048 - Standard Test Method for Measuring the Effective Surface Roughness of Optical Components by Total Integrated Scattering (Withdrawn 2003) ASTM-F1049 - Standard Practice for Shallow Etch Pit Detection on Silicon Wafers (Withdrawn 2003 ASTM-F106 - Standard Specification for Brazing Filler Metals for Electron Devices ASTM-F1094 - Stan