福禄克Fluke 810 测振仪810 内存易失性声明.pdf

Instrument Security Procedures Model: 810 Product Name: Vibration Tester Instrument Description: The Fluke 810 Vibration Tester is used in vibration analysis to diagnose mechanical faults on rotating equipment. Memory Description: 1. 64kB Internal SRAM (On-chip RAM) This area is used by iROM (On-chip boot code) and cannot be accessed by user. 2. 256MB DDR2 RAM (System RAM) This area is used by OS and application (FW and UI) and cannot be accessed by user. 3. 128MB NAND Flash This memory area is used for storing boot-loader, OS image, firmware, UI application, and Diagnostic engine images. 4. 256 bytes EEPROM This area is used to store calibration information and related data. 1-byte -- Calibration status 4-bytes -- Last calibrated date 96-bytes -- Calibration constants 5-bytes -- Calibration password 7-bytes -- Reserved for EEPROM test 5. Storage Card a. 2GB Internal Storage Card Instrument Setup settings and Transactional Data (Machine Setup, Measurement, Diagnostic data) is stored in the internal SD card. Also used for storing FW/UI/DE debug log files. b. 2GB External Storage card Once internal SD card is full, transactional data is stored in the external SD card. Memory Cleaning Instructions: 1. Internal SRAM/DDR2 RAM This area is volatile and the contents are lost on power off. 810 SOMV 1 of 2 3/22/2010 2. Nand Flash • The OS/boot-loader images are updated from the boot-loader menu using the serial port. As serial port is not accessible externally, the device has to be op