Hi3511V110可靠性试验报告.docVIP

Reliability test report of Hi3511 PAGE PAGE 8 Hisilicon Technologies Co.,Ltd. Product version Confidentiality level V110 Secret Product name:Hi3511 Total pages：9 ?The Reliability Test Report Of Hi3511/Hi3512 Prepared by 罗静芳 Date 200 Reviewed by 湛灿辉 Date 200 Granted by 夏君 Date 200 海思半导体有限公司  Catalog TOC \o 1-3 \h \z \u Instruction 3 1、Definition 4 1.1 Preconditioning Testing（PC） 4 1.2 Temperature Cycling (TC) 4 1.3 Highly Accelerated Stress Test (HAST) 4 1.4 High Temperature Operational Life (HTOL) 5 1.5 Electrostatic Discharge ：Human Body Model 5 1.6 Latch-Up Test