Intel英特尔质量和可靠性第7卷：质量测试覆盖率.pdf

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QualityReliabilityVol.7:

TestCoverageforQuality

TechnicalPaper

Introduction

Intherapidlyevolvingfieldofleading-edgesemiconductors,ensuringthequality

andreliabilityofIntegratedCircuits(ICs)–manufacturedonsiliconprocessesof

decreasingsizeandincreasingcomplexity–isofcriticalimportance.ForIntel,

qualitymeansthatitsproductsworkasspecifiedatthetimetheyare

manufacturedandintegratedintosystems.

Asdevicesbecomeincreasinglycomplex,minimizingthelevelofquality

escapesisachallengethatrequiresacomprehensivemanufacturingtestflow.

TableofContentsQualityescapescanresultfromavarietyofsources,includingadefect

introducedduringthemanufacturingprocessthatwasnotsubsequently

Introduction1detectedbythetestflowdesignedtoscreendefectiveunitspriortoshipment.

CustomerBenefits2Defectiveunitsthatareundetectedduringthetestflowandshiptocustomers

are“testescapes.”

TestCoverage2

ManufacturingTestFlow..5Thispaperwillfocusonconceptsofdefectsandnotionsofdefectcoverage,

Intel’smanufacturingtestflow,andthetypesofcontentthatareutilizedin

TestContents6screeningfordefectiveparts.Itshouldbeconsideredanintroductiontothetopic

Conclusion8ofTestCoverageforQualityandafoundationforfurtherexplorationofspecific

topicsofinterest.

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