2025《晶体管图示仪国内外研究现状文献综述》2700字.docxVIP

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晶体管图示仪国内外研究现状文献综述

晶体管图示仪作为测量晶体管元件的重要仪器，它的发展经历了模拟式电子管时代和数字式集成电路混合时代ADDINEN.CITEEndNoteCiteAuthorWang/AuthorYear2020/YearRecNum93/RecNumDisplayTextstyleface=superscript[8]/style/DisplayTextrecordrec-number93/rec-numberforeign-keyskeyapp=ENdb-id=2wd5eeve5x5w5iesx2n5zapj9sfvvp9ztxx9timestamp=161795105293/key/foreign-keysref-typename=ConferenceProceedings10/ref-typecontributorsauthorsauthorWang,Bo/authorauthorTang,Yong/author/authors/contributorstitlestitleTransientCharacteristicAnalysisofIGBTVoltageBreakdownFailure/titlesecondary-titleProceedingsofthe20204thInternationalConferenceonElectronicInformationTechnologyandComputerEngineering/secondary-title/titlespages855-859/pagesdatesyear2020/year/datesurls/urls/record/Cite/EndNote[8]。

1.1晶体管图示仪国内研究现状

二十一世纪初，国内上海五九自动化厂采用研制出YB4811型半导体管图示仪（如图1-1所示），采用D/A变换器和模拟分立器件，提高了微电流测量范围。由于内部采用模拟式分立器件组成以及硬件电路复杂，导致仪器笨重、精确度不高、测试数据无法读出、只适用于测试某类晶体管，局限性大ADDINEN.CITEEndNoteCiteAuthor李丙旺/AuthorYear2004/YearRecNum15/RecNumDisplayTextstyleface=superscript[9]/style/DisplayTextrecordrec-number15/rec-numberforeign-keyskeyapp=ENdb-id=2wd5eeve5x5w5iesx2n5zapj9sfvvp9ztxx9timestamp=161771059115/key/foreign-keysref-typename=JournalArticle17/ref-typecontributorsauthorsauthor李丙旺/author/authors/contributorsauth-address华东光电集成器件研究所,蚌埠,233042/auth-addresstitlestitleXJ4810半导体管特性图示仪无级族信号故障的检修/titlesecondary-title计量技术/secondary-title/titlesperiodicalfull-title计量技术/full-title/periodicalpages58-60/pagesnumber5/numberkeywordskeyword阶梯信号/keywordkeyword级族信号/keywordkeyword狭脉冲/keyword/keywordsdatesyear2004/year/datesisbn1000-0771/isbnurlsrelated-urlsurl/details/detail.do?_type=perioamp;id=jljs200405025/url/related-urls/urlselectronic-resource-num10.3969/j.issn.1000-0771.2004.05.025/electronic-resource-numremote-database-provider北京万方数据股份有限公司/remote-database-providerlanguagechi/language/record/Cite/EndNote[9]。

随着科技不断发展，产生了数字式微控制单元构成数据采集卡，在PC端显示被测晶体管特性曲线和参数的数字式晶体管图示仪，数字式图示仪能准确测量并显示测试结果，克服了模拟式晶体管图示仪的仪器笨重和精度低等缺点。

2006年，方尚侠在分析传统