纳米科学与技术中开尔文探针力显微术.pdfVIP

KelvinProbeForceMicroscopyinNanoscienceandNanotechnology

ab,*a,*

DaLuo,HaoSun,andYanLi

aBeijingNationalLaboratoryforMolecularSciences,KeyLaboratoryforthePhysics

andChemistryofNanodevices,CollegeofChemistryandMolecularEngineering,

PekingUniversity,Beijing100871,

bNanoSurfacesDivision,Bruker(Beijing)ScientificTechnologyCo.,Ltd.,11

ZhongguancunSouthStreet,Beijing100081,

表格内容

定义

概述

1.0

引言

2.0

开尔文探针方法的物理背景与理论

2.1

基础

2.2

电场力与电场力梯度

2.3

AM‑KPFM

2.4

FM‑KPFM

2.5

无电位反馈的

KPFM

3.0

KPFM测