一种有效的老化路径约减方法.pdfVIP

中国科技论文在线 一种有效的老化路径约减方法# 1 2 1 1 2** 邢璐 ，梁华国 ，张丽娜 ，严鲁明 ，余天送 （1. 合肥工业大学计算机与信息学院，合肥 230009； 5 2. 合肥工业大学电子科学与应用物理学院，合肥 230009） 摘要：随着 CMOS 集成电路工艺尺寸的不断缩小，电路可靠性问题日益严重，而由 NBTI 效应引起的电路老化问题尤其突出。由于实际电路大多比较复杂，路径较多，如果对所有路 径进行老化预测，工作量会非常大。本文针对这一实际难题提出了一种基于电路路径中门种 类和数目的迭代算法，用来划分和约减电路中不被老化影响电路功能的电路路径。该方法根 10 据路径中每类门的数目和没种类对电路老化的不同影响程度将电路路径进行分类，约减掉不 需要预测老化的路径，减少了老化预测的工作量，提高了老化预测的效率。 关键词：老化预测；关键路径；路径约减；电路可靠性 中图分类号：TP306+.2 15 An Efficient Method to Reduce Aging Path 1 2 1 1 2 XING Lu , LIANG Huaguo , ZHANG Lina , YAN Luming , YU Tiansong (1. School of Computer and Information, HeFei University of Technology, HeFei 230009; 2. School of Electronic ScienceApplied Physics, HeFei University of Technology, HeFei 230009) 20 Abstract: As CMOS technology scaling of integrated circuit ,the problems of circuit reliability is more serious,and the circuit aging cased by NBTI is especially conspicuous.In fact,most of circuits are complicated and there are many paths in a circuit.The workload will be large if we predict aging of all paths.In this work, we proposed an iterative algorithm based on types and number of logic gates on one path,which used to reduce the protected circuit paths.In the algorithm,We 25 classify all paths by the number of every kind of logic gate and different influence of logic gate