HgCdTe异质外延界面状况的高分辨X射线三轴衍射探究.pdfVIP

CHARACTERIZATION OF HIGH RESOLUTION X-RAY TRIPLE AXIS DIFFRACTION FOR HgCdTe HETERINTERFACE WANG Qingxue WEI Yanfeng FANG Weizheng YANG Jianrong HE Li Research Center for Advanced Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083 China Abstract: The method of heterinterface analysis by using reciprocal space maps is introduced and used to characterize the HgCdTe/CdZnTe heterinterface grown by LPE. The experimental results show that the perpendicular mismatch of HgCdTe/CdZnTe heterint