原创力文档- 5
- 0
- 约10.46万字
- 约 9页
- 2017-08-17 发布于湖北
- 举报
INTEGRATION, the VLSI journal 50 (2015) 107–115
Contents lists available at ScienceDirect
INTEGRATION, the VLSI journal
journal homepage: /locate/vlsi
A fast model for analysis and improvement
of gate-level circuit reliability
Chunhong Chen n, Ran Xiao
Department of Electrical and Computer Engineering, University of Windsor, Ontario, Canada N9B 3P4
a r
您可能关注的文档
- a dansyl based fluorescence chemosensor for hg2+ and its application in the complicated environment samples论文.pdf
- a decentralized energy efficient hierarchical cluster-based routing algorithm for wireless sensor networks论文.pdf
- a decision support model for determining the level of product variety with marketing and supply chain considerations论文.pdf
- a decision support system for the operational production planning and scheduling of an integrated pulp and paper mill论文.pdf
- a decision support system model in estimating budgets for standard figure tools at mattel toys论文.pdf
- a definition of systems thinking a systems approach论文.pdf
- a delayed eco-epidemiological system with infected prey and predator subject to the weak allee effect论文.pdf
- a desk-top personal computer for finite element post-processing论文.pdf
- a detailed east asian monsoon history surrounding the ‘mystery interval’ derived from three chinese speleothem records论文.pdf
- a dialog with five art materials creators share their art making experiences论文.pdf
文档评论（0）