PVDF薄膜的低维化制备和结构研究.pdfVIP

PVDF 薄膜的低维化制备和结构研究/ 惠迎雪等 ∀ 1 ∀ PVDF * 1,2 1 2 惠迎雪 , 樊慧庆 , 刘卫国 ( 1 , 710072; 2 , 710032) 采用真空热蒸发技术在单晶硅基底上沉积 PVDF 薄膜, 通过 析阻蒸温度对薄膜沉积速率和真空室气 压变化的影响研究了PVDF 镀膜过程, 同时利用傅立叶变换衰减全反射红外光谱( ATRFTIR) X 射线衍射( XRD) 和差热 析( DSC) 对薄膜的晶型结构进行了表征 析, 结果发现, 真空热蒸发技术可制备具有高度取向性的 晶相 PVDF 薄膜, 且薄膜中不含 C= C 键相比于 PVDF 树脂粉末, 所得薄膜的结晶度明显增大而 子量显著减小, 实现 了PVDF 薄膜的低维化制备 PVDF Research on the Preparation and Microstructure of Low Dimensional PVDF Thin Films 1,2 1 2 XI Y ingxue , FA N Hui ing , LIU Weiguo ( 1 State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University , Xi an 710072; 2 Shaanxi Province Key Laboratory of Thin Film T echnology and Opt ical Test Open, Xi an T echnological University , Xi an 710032) Abstract Ferroelectric poly( vinylidene fuoride) ( PVDF) films are deposited on monocrystalline silicon sub st rate by vacuum t hermal evaporation technology . T he effect of resistance evaporation temperature on deposition rate and vacuum is studied t o investigate deposition process of PVDF. The films are characterized by attenuat ed t otal re flectionFourier transform inf rared(ATRFTIR) , Xray diffraction( XRD) and differential scanning calorimetry( DSC) . The results show that the low dimensional oriented phase thin films, free of other C= C band are obtained by vacuum thermal evaporation t echnology. The degrees of crystallinity are increased and molecular weights of oriented thin films