Sequential Test Generation with Advanced Illegal State Search.pdfVIP

SequentialTestGenerationwithAdvancedIllegal StateSearch∗ M.H.Konijnenburg J.Th.vanderLinden A.J.vandeGoor DepartmentofElectricalEngineering DelftUniversityofTechnology,Delft,TheNetherlands E-mail: M.H.Konijnenburg@et.tudelft.nl Abstract • It increases the defect coverage. Because testing is performed at-speed, defects which manifest them- TPG for synchronous sequential circuits has received selves as delay faults may be detected. wide attention over the last two decades, yet unlike for (full-scan) combinational circuits, for many sequential • Often not all FFs can be scanable. FFs in the crit- benchmark circuits 100% fault efficiency still cannot be ical path are often excluded from being scanable, reached. This illustrates the complexity of sequential or FFs are not made scanable to save chip-area. circuit ATPG. Over the last two decades, much research has been The huge search space, which exists during sequen- carried out on TPG for synchronous sequential circuits tial circuit TPG, is the main reason for this complexity. (without a reset-state) using the single time observa- Powerful techniques and heuristics are required to cope tion model [2] and the stuck-at fault model (STPG) [3] with this search space. One way to reduce the search [4] [5] [6] [7]. However, the problem of STPG is still space is the detection of illegal states. These states can- not solved, illustrating the comp