Fe(1-x)CoxSi2薄膜的光学性质实验研究.pdf

光 电子 激 光 第 卷 第 期 年 月 12 8 2OO1 8 ournal of Optoelectronics Laser Vol.12 No.8 Aug. 2OO1 文章编号,1OO5-OO86(2OO1)O8-O781-O4 (1-x) x 2 Experimental Study Of Optical prOperties Of Fe CO Si Thin Films - , , - , - , - Z~ANG Rong jun Z~OU Peng Z~ANG Ying jun Z~ENG Yu xiang C~EN Liang yao (Dept of Optical Science and Engineering fudan University Shanghai. , , 2OO433,China) , (1-x) x 2 Abstract A series of fe Co Si thin films with variation of x was prepared by reactive deposition epi- taxy RDE method The optical properties of the samples are reported in this paper The dielectric( ) . . function of the samples was measured by spectroscopic ellipsometer in the photon energy range of O.26 *4.8O eV at room temperature Itfs interesting to find that the dielectric function of fe. (1-x) x 2 Co Si films , ) is strongly dependent on the phase of the films a The dielectric function spectra show interference peaks in the low photon energy range for the B phase fe(1-x) x 2 ; ) Co Si samples b The