X射线荧光光谱仪S2 Instrument.ppt

X射线荧光光谱分析技术 一、基础理论 二、仪器的结构与分析条件的选择 三、定量分析方法和基体效应校正 电磁辐射 X射线的产生 X射线的产生: 特征谱线（光电效应） 会产生特征谱线的元素 荧光产额 特征谱线 特征谱线 特征谱线 谱线的相对强度 X射线的性质 作为一种电磁波，具有波粒二相性的特点： 光电效应 吸收 散射: 相干散射 不相干散射 衍射 仪器结构：二类X射线荧光光谱仪WD-XRF ED-XRF X射线光管发射的原级X射线入射至样品，激发样品中各元素的各条特征谱线 需要将各条谱线的能量（或波长）分开，并探测到各条谱线的强度 X-ray Fluorescence AnalysisWavelength-dispersive XRF WD-XRF an analyzer crystal separates the various wavelengths l energies the detector records only the number N of X-ray photons at a given wavelength energy X-ray Fluorescence AnalysisWavelength-dispersive XRF WD-XRF Wavelength-dispersive sequential X-ray spectrometers like the S4 EXPLORER and the S4 PIONEER offer the best analytical performance for nearly all applications The loss of intensity by collimators and crystals has to be compensated by excitation with a high-power X-ray tube S4: 1- 4 kW Cost of ownership and size of the instrument cannot be reduced below a certain limit without loosing the analytical advantages of WD-XRF X-ray Fluorescence Analysis Energy-dispersive XRF EDX , ED-XRF The detector is used to record both at the same time the energy E and the number N of X-ray photons at a given energy X-ray Fluorescence Analysis Energy-dispersive XRF EDX , ED-XRF EDX spectrometers are much smaller than wavelength-dispersive systems less components only a small loss of intensity* by close and direct coupling between sample and detector low-power X-ray tubes S2: 50 W The cost of ownership is significantly lower for typical EDX systems than for WD-XRF * high loss of intensity for instruments using secondary targets or polarizers X-ray Fluorescence Analysis Energy-dispersive XRF EDX , ED-XRF The various types of EDX spectrometers cover a wide range in performance, size and cost - from small benchtops to high-end floor standing units None* of these EDX systems can match the analytical performance of the S4 EXPLORER S4 PIONEER * very few exceptions for special applications with some high-end